Autoria: SOUZA, T. L. P. O. de; PEREIRA, H. S.; FARIA, L. C. de; MELO, L. C.

Resumo: Despite important biotic stresses to common bean, Anthracnose (ANT) and Angular Leaf Spot (ALS) can cause losses of up to 80 % and occur in more than 60 countries around the world. Genetic resistance is the most sustainable strategy to manage these diseases. Thus, we aimed to (1) identify new SNP markers associated with ALS and ANT resistance loci in elite common bean lines, and (2) provide a functional characterization of the DNA sequences containing the identified SNP markers. We evaluated 60 inbred lines, under field conditions, which represent the elite germplasm developed by the Embrapa common bean breeding program across 22 years, in terms of severity of the ALS and ANT. The lines were genotyped with 5,398 SNPs. Then, a Mixed Linear Model was run to determine the SNP-trait associations. We observed two-significant marker-trait associations reacting to ANT, both located on chromosome Pv-02. These markers explained 25 % of the phenotypic variation. For ALS, only one significant marker-trait association was observed, which is located in chromosome Pv-10 and explained 19 % of the phenotypic variation. These markers, along with others already used, will be useful to add or keep ANT and ALS resistance loci identified in this work in the new carioca and black seeded cultivars.

Ano de publicação: 2019

Tipo de publicação: Artigo de periódico

Unidade: Embrapa Arroz e Feijão

Palavras-chave: Anthracnose, Antracnose, Beans, Colletotrichum lindemuthianum virus, Disease resistance, Feijão, Mancha Angular, Marker-assisted selection, Phaseolus Vulgaris, Pseudocercospora, Resistência