Autoria: VALDO, S. C. D.; WENDLAND, A.; GONÇALVES, L. A.; SILVA, C. S.; ARAÚJO, L. G.

Resumo: Bacterial wilt of the common bean caused by Curtobacterium flaccumfacienspv. flaccumfaciensresults in economic losses. The aim of this study was to analyze the colonization of C. flaccumfaciens pv. flaccumfaciens in resistant, moderately resistant, and susceptible genotypes of common bean plants. The genotypes OuroBranco and IPA 9 (resistant), Diacol Calima (moderately resistant), and CNFRS 11997 and CNFP 10429 (susceptible) were inoculated in the epicotyl, with 100 ?L of bacterial suspension of the BRM 14933(Cff25). Disease severity was evaluated 21 days after inoculation (DAI), on a scale from 1 to 9. Plant samples were prepared for scanning electron microscopy analyses. Ouro Branco and IPA 9 (resistant) plants exhibited low colonization, the formation of filaments surrounding bacterial cells and vestures more developed in the pit the xylem vessels. Diacol Calima (moderately resistant) plants presented lower levels of colonization and filament formation than that of resistant cultivars. CNFC 10429 and CNFRS 11997 (susceptible) showed high levels of colonization in the xylem and vessel obstruction, preventing water and nutrient flow, which explains the symptoms of wilt and plant death. Thus, resistance to C. flaccumfacienspv. flaccumfacienscan be explained by plant’s capacity to limit pathogen propagation as a post-formed defense mechanismin this pathosystem

Ano de publicação: 2022

Tipo de publicação: Artigo de periódico

Unidade: Embrapa Arroz e Feijão

Palavras-chave: Bacterial wilt, Beans, Curtobacterium flaccumfaciens, Curtobacterium flaccumfaciens pv. flaccumfaciens, Feijão, Infection, Interação Genética, Phaseolus Vulgaris, Plant pathogenic bacteria