Modeling sugar cane yield with a process-based model from site to continental scale: uncertainties arising from model structure and parameter values.

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Author(s): VALADE, A.; CIAIS, P.; VUICHARD, N.; VIOVY, N.; CAUBEL, A.; HUTH, N.; MARIN, F. R.; MARTINÉ, J.-F.

Summary: This study reveals the spatial and temporal patterns of uncertainty variability for a highly parameterized agro-LSM and calls for more systematic uncertainty analyses of such models.

Publication year: 2014

Types of publication: Journal article

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